Steel

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Hardness Tester

November 30th, -0001

Fully integrated and handy Leeb hardness tester with a compact and robust housing. Ideally suited for quick on-site hardness tests. Optional DL probe for confined spaces and recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a PC

Entry model for quick on-site tests

Compact housing and automatic angle correction allow flexible use

Comes with the high accuracy known for all Equotip products

Native Scale

HL

Measuring Range

150 – 950 HL

Measuring Accuracy

± 4 HL (0.5% at 800 HL)

Available Scales

HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only)

Available Probes

Leeb D / DL

Combination With Other Methods

 

Average Roughness Ra (µm / µinch)

2 / 80

Minimum Mass (kg / lbs)

0.05 / 0.2

Minimum Thickness (mm / inch)

3 / 0.12

UCI Hardness Tester

November 30th, 2001

Flexible UCI hardness tester for fine-grained material with any shape and heat-treated surfaces. The patented adjustable test load enables a wide range of applications. Rugged touchscreen with enhanced software features and analysis functions

Combine with Leeb and Portable Rockwel

On-screen feedback to reduce measurement inaccuracies caused by the operator

Ready-to-go reports through powerful built-in reporting feature

Native Scale

HV (UCI)

Measuring Range

20 - 2000 HV

Measuring Accuracy

± 2% (150 - 950 HV)

Available Scales

HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA

       

Available Probes

UCI (Adjustable HV1 - HV5)

Combination With Other Methods

Leeb, Portable Rockwell

Average Roughness Ra (µm / µinch)

12.5 / 500

Minimum Mass (kg / lbs)

0.3 / 0.66

Minimum Thickness (mm / inch)

5 / 0.2

       

Display

7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor

Memory

Internal 8 GB flash memory (> 1’000’000 measurements)

Connections

USB host / device and Ethernet

Rockwell Hardness Tester

November 30th, 2001
 

Portable Rockwell hardness tester for scratch-sensitive, polished and thin parts. It features excellent sensitivity through small penetration of a few micrometer. Rugged touchscreen with enhanced software features and analysis functions. 

Combine with Leeb and UCI

Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers

Ready-to-go reports through powerful built-in reporting feature

Native Scale

µm, µinch

Measuring Range

0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV

Measuring Accuracy

± 0.8 µm; ~ ± 1.0 HRC

Available Scales

HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA

Available Probes

Portable Rockwell (50N)

Combination With Other Methods

Leeb, UCI

Average Roughness Ra (µm / µinch)

2 / 80

Minimum Mass (kg / lbs)

No requirement

Minimum Thickness (mm / inch)

10 x indendation depth

سختی سنج Leeb

November 30th, 2001

سختی سنج Leeb

سختی سنج چند منظوره Leeb جهت آزمایش قطعات سنگین، بزرگ و یا نصب شده با صفحه نمایش لمسی نازک

دارای ویژگی های نرم افزاری پیشرفته و توابع تجزیه و تحلیل
استفاده از پروب کامل Leeb و ترکیب آن با Rockwell و UCI

Native Scale

HL

Measuring Range

150 - 950 HL

Measuring Accuracy

± 4 HL (0.5% at 800 HL)

Available Scales

HB, HV, HRA, HRB, HRC, HS, MPA

Available Probes

Leeb D / DC / DL / S / E / G / C

Combination With Other Methods

Portable Rockwell, UCI

Average Roughness Ra (µm / µinch)

7 / 275 (Leeb G)

Minimum Mass (kg / lbs)

0.02 / 0.045 (Leeb C)

Minimum Thickness (mm / inch)

1 / 0.04 (Leeb C)

ساخت کمپانی Proceq سوئیس

Leeb Hardness Tester

November 30th, -0001

Versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. Rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis. Enhanced software features and analysis functions

Use full Leeb probe portfolio and combine with Portable Rockwell and UCI

Comes with the high accuracy known for all Equotip products

Ready-to-go reports through powerful built-in reporting feature

Native Scale

HL

Measuring Range

150 - 950 HL

Measuring Accuracy

± 4 HL (0.5% at 800 HL)

Available Scales

HB, HV, HRA, HRB, HRC, HS, MPA

Available Probes

Leeb D / DC / DL / S / E / G / C

Combination With Other Methods

Portable Rockwell, UCI

Average Roughness Ra (µm / µinch)

7 / 275 (Leeb G)

Minimum Mass (kg / lbs)

0.02 / 0.045 (Leeb C)

Minimum Thickness (mm / inch)

1 / 0.04 (Leeb C)